Assessing the Quality of Binomial Samplers: A Statistical Distance Framework
Uddalok Sarkar, Sourav Chakraborty, Kuldeep S. Meel
摘要
Abstract Randomized algorithms depend on accurate sampling from probability distributions, as their correctness and performance hinge on the quality of the generated samples. However, even for common distributions like Binomial, exact sampling is computationally challenging, leading standard library implementations to rely on heuristics. These heuristics, while efficient, suffer from approximation and system representation errors, causing deviations from the ideal distribution. Although seemingly minor, such deviations can accumulate in downstream applications requiring large-scale sampling, potentially undermining algorithmic guarantees. In this work, we propose statistical distance as a robust metric for analyzing the quality of Binomial samplers, quantifying deviations from the ideal distribution. We derive rigorous bounds on the statistical distance for standard implementations and demonstrate the practical utility of our framework by enhancing APSEst, a DNF model counter, with improved reliability and error guarantees. To support practical adoption, we propose an interface extension that allows users to control and monitor statistical distance via explicit input/output parameters. Our findings emphasize the critical need for thorough and systematic error analysis in sampler design. As the first work to focus exclusively on Binomial samplers, our approach lays the groundwork for extending rigorous analysis to other common distributions, opening avenues for more robust and reliable randomized algorithms.
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- On Testing of SamplersKuldeep S. Meel, Yash Pote, Sourav ChakrabortyNeurIPS 2020 · 被引用 20 次
- Testing Probabilistic CircuitsYash Pote, Kuldeep S. MeelNeurIPS 2021 · 被引用 10 次
- On Scalable Testing of SamplersYash Pote, Kuldeep S. MeelNeurIPS 2022 · 被引用 8 次
- Testing Self-Reducible SamplersRishiraj Bhattacharyya, Sourav Chakraborty, Yash Pote, Uddalok Sarkar 等AAAI 2024 · 被引用 2 次
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