Testing Self-Reducible Samplers
Rishiraj Bhattacharyya, Sourav Chakraborty, Yash Pote, Uddalok Sarkar, Sayantan Sen
摘要
Samplers are the backbone of the implementations of any randomised algorithm. Unfortunately, obtaining an efficient algorithm to test the correctness of samplers is very hard to find. Recently, in a series of works, testers like Barbarik, Teq, Flash for testing of some particular kinds of samplers, like CNF-samplers and Horn-samplers, were obtained. But their techniques have a significant limitation because one can not expect to use their methods to test for other samplers, such as perfect matching samplers or samplers for sampling linear extensions in posets. In this paper, we present a new testing algorithm that works for such samplers and can estimate the distance of a new sampler from a known sampler (say, uniform sampler). Testing the identity of distributions is the heart of testing the correctness of samplers. This paper's main technical contribution is developing a new distance estimation algorithm for distributions over high-dimensional cubes using the recently proposed sub-cube conditioning sampling model. Given subcube conditioning access to an unknown distribution P , and a known distribution Q defined over 0, 1 n , our algorithm CubeProbeEst estimates the variation distance between P and Q within additive error ζ using O n 2 /ζ 4 subcube conditional samples from P . Following the testing-via-learning paradigm, we also get a tester which distinguishes between the cases when P and Q are ε-close or η-far in variation distance with probability at least 0.99 using O(n 2 /(η -ε) 4 ) subcube conditional samples. The estimation algorithm in the sub-cube conditioning sampling model helps us to design the first tester for selfreducible samplers. The correctness of the testers is formally proved. On the other hand, we implement our algorithm to create CubeProbeEst and use it to test the quality of three samplers for sampling linear extensions in posets.
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引用它的顶会 Paper3
- Monotonicity Testing of High-Dimensional Distributions with Subcube ConditioningDeeparnab Chakrabarty, Xi Chen, Simeon Ristic, C. Seshadhri 等STOC 2025 · 被引用 2 次
- Instance Dependent Testing of Samplers Using Interval ConditioningRishiraj Bhattacharyya, Sourav Chakraborty, Yash Pote, Uddalok Sarkar 等AAAI 2026
- Assessing the Quality of Binomial Samplers: A Statistical Distance FrameworkUddalok Sarkar, Sourav Chakraborty, Kuldeep S. MeelCAV 2025
它引用的顶会 Paper5
- On Testing of SamplersKuldeep S. Meel, Yash Pote, Sourav ChakrabortyNeurIPS 2020 · 被引用 20 次
- Testing Probabilistic CircuitsYash Pote, Kuldeep S. MeelNeurIPS 2021 · 被引用 10 次
- Random Restrictions of High Dimensional Distributions and Uniformity Testing with Subcube ConditioningClément L. Canonne, Xi Chen, Gautam Kamath, Amit Levi 等SODA 2021 · 被引用 10 次
- On Scalable Testing of SamplersYash Pote, Kuldeep S. MeelNeurIPS 2022 · 被引用 8 次
- Uniformity Testing over Hypergrids with Subcube ConditioningXi Chen, Cassandra MarcussenSODA 2024 · 被引用 2 次
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