Kernelized Stein Discrepancy Tests of Goodness-of-fit for Time-to-Event Data
Tamara Fernandez, Nicolas Rivera, Wenkai Xu, Arthur Gretton
Abstract
Survival Analysis and Reliability Theory are concerned with the analysis of time-to-event data, in which observations correspond to waiting times until an event of interest such as death from a particular disease or failure of a component in a mechanical system. This type of data is unique due to the presence of censoring, a type of missing data that occurs when we do not observe the actual time of the event of interest but, instead, we have access to an approximation for it given by random interval in which the observation is known to belong. Most traditional methods are not designed to deal with censoring, and thus we need to adapt them to censored time-to-event data. In this paper, we focus on non-parametric goodness-of-fit testing procedures based on combining the Stein's method and kernelized discrepancies. While for uncensored data, there is a natural way of implementing a kernelized Stein discrepancy test, for censored data there are several options, each of them with different advantages and disadvantages. In this paper, we propose a collection of kernelized Stein discrepancy tests for time-to-event data, and we study each of them theoretically and empirically; our experimental results show that our proposed methods perform better than existing tests, including previous tests based on a kernelized maximum mean discrepancy. * TF, WX, AG are grateful for the support from the Gatsby Charitable Foundation. NR is supported by Thomas Sauerwalds ERC Starting Grant 679660. † Corresponding author. ‡ Same contribution.
Ask about this paper
Your agent reads all of it.
Lune indexed this paper to the last equation, along with the top-tier papers that cite it. Ask a question and the answer quotes them.
Your agent calls
Luneget_paper_fulltext
Free to start. No credit card required.
Terminal
Install the CLIlune papers fulltext 3bce7037-e20c-45a2-980c-dc9a377538d6Cited by top-tier papers3
- KSD Aggregated Goodness-of-fit TestAntonin Schrab, Benjamin Guedj, Arthur GrettonNeurIPS 2022 · 26 citations
- A Kernel Stein Test of Goodness of Fit for Sequential ModelsJerome Baum, Heishiro Kanagawa, Arthur GrettonICML 2023 · 12 citations
- Gradient-Free Kernel Stein DiscrepancyMatthew Fisher, Chris J. OatesNeurIPS 2023 · 5 citations
Related papers
- Interpretable Stein Goodness-of-fit Tests on Riemannian ManifoldWenkai Xu, Takeru MatsudaICML 2021 · 10 citations
- Efficient Aggregated Kernel Tests using Incomplete -statisticsAntonin Schrab, Ilmun Kim, Benjamin Guedj, Arthur GrettonNeurIPS 2022 · 42 citations
- Using Perturbation to Improve Goodness-of-Fit Tests based on Kernelized Stein DiscrepancyXing Liu, Andrew B. Duncan, Axel GandyICML 2023 · 8 citations
- A Kernelised Stein Statistic for Assessing Implicit Generative ModelsWenkai Xu, Gesine D. ReinertNeurIPS 2022 · 4 citations
- Sliced Kernelized Stein DiscrepancyWenbo Gong, Yingzhen Li, José Miguel Hernández-LobatoICLR 2021 · 14 citations
