Lune

ICML2023Top-tier venue

A Kernel Stein Test of Goodness of Fit for Sequential Models

Jerome Baum, Heishiro Kanagawa, Arthur Gretton

2023Year
12Citations
5Top-tier citations

Abstract

We propose a goodness-of-fit measure for probability densities modeling observations with varying dimensionality, such as text documents of differing lengths or variable-length sequences. The proposed measure is an instance of the kernel Stein discrepancy (KSD), which has been used to construct goodness-of-fit tests for unnormalized densities. The KSD is defined by its Stein operator: current operators used in testing apply to fixed-dimensional spaces. As our main contribution, we extend the KSD to the variable-dimension setting by identifying appropriate Stein operators, and propose a novel KSD goodness-of-fit test. As with the previous variants, the proposed KSD does not require the density to be normalized, allowing the evaluation of a large class of models. Our test is shown to perform well in practice on discrete sequential data benchmarks.

Ask about this paper

Your agent reads all of it.

Lune indexed this paper to the last equation, along with the top-tier papers that cite it. Ask a question and the answer quotes them.

Questions to start from

Your agent calls

Luneget_paper_fulltext

Ask in Lune

Free to start. No credit card required.

Cited by top-tier papers5

Ask how each one uses it

Builds on2

Related papers

Dusk over the sea between two cliffs drawn in fine vertical lines