How Many Code and Test Cases Are Enough? Evaluating Test Cases Generation from a Binary-Matrix Perspective
Xianzhen Luo, Jinyang Huang, Wenzhen Zheng, Qingfu Zhu, Mingzheng Xu, Yiheng Xu, YuanTao Fan, Wanxiang Che
摘要
Evaluating test cases automatically generated by Large Language Models (LLMs) is a critical yet challenging task. Existing benchmarks often evaluate the exclusion ratio on large, unstructured collections of wrong codes, suffering from high computational costs and score inflation. Furthermore, they inadvertently reward generators that detect common, trivial bugs, while failing to penalize their inability to identify rare yet critical faults. In this work, we connect two fundamental questions: (1) What is the minimal set of wrong codes sufficient to represent the entire error space? and (2) What is the minimal set of test cases needed to distinguish them? We introduce a novel framework that formalizes benchmark construction as finding an optimal diagnostic basis in a binary code-test matrix, where rows represent wrong codes and columns represent test case results. The rank of this matrix specifies the minimal number of independent error patterns (wrong codes) and provides a tight upper bound on the number of test cases required for complete fault coverage. Our objective is to identify a basis of size equal to the matrix rank that maximizes internal diversity. To tackle this NP-hard problem, we propose WrongSelect, an efficient approximation algorithm to select maximally diverse wrong codes. Applying this framework to millions of competitive programming submissions, we construct TC-Bench, a compact, diverse, and inflation-resistant benchmark. Extensive experiments show that even the most advanced test case generation methods achieve only 60% exclusion rates on TC-Bench, exposing a significant gap in their diagnostic power and highlighting substantial room for future improvement. Our dataset is available at: https://huggingface.co/datasets/Luoberta/TC-Bench and our code is at: https://github.com/Luowaterbi/TC-Bench.
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