2DIO: Configurable and Cache-Accurate Trace Generation for Storage Benchmarking

We introduce 2DIO, a microbenchmark creating cache-accurate, stressful I/O traces. While existing tools are limited to generating traces with well-behaved, concave hit ratio curves, 2DIO produces ones with tunable complex cache behaviors, particularly performance cliffs and plateaus.

Our framework encodes a workload as a compact parameter triplet, capturing both short-term recency and long-term frequency. This parsimonious parameterization allows researchers to easily translate individual adjustments into predictable cache effects across various eviction policies, and enables the parameter space to be "swept" for exhaustive exploration of desired cache behavior, or to mimic real traces by calibrating parameters to match observed behaviors.

The tuned parameters are portable, meaning if the scale of the system under evaluation changes, so too will the footprint and length of the trace, while the relative cache behaviors are preserved.

Evaluations demonstrate 2DIO's ability to generate traces across a continuum of "what-if" cache behaviors and to reproduce real-world ones with high accuracy.