Sharing More and Checking Less: Leveraging Common Input Keywords to Detect Bugs in Embedded Systems
Libo Chen, Yanhao Wang, Quanpu Cai, Yunfan Zhan, Hong Hu, Jiaqi Linghu, Qinsheng Hou, Chao Zhang, Haixin Duan, Zhi Xue
摘要
IoT devices have brought invaluable convenience to our daily life. However, their pervasiveness also amplifies the impact of security vulnerabilities. Many popular vulnerabilities of embedded systems reside in their vulnerable web services. Unfortunately, existing vulnerability detection methods cannot effectively nor efficiently analyze such web services: they either introduce heavy execution overheads or have many false positives and false negatives.
In this paper, we propose a novel static taint checking solution, SaTC, to effectively detect security vulnerabilities in web services provided by embedded devices. Our key insight is that, string literals on web interfaces are commonly shared between front-end files and back-end binaries to encode user input. We thus extract such common keywords from the frontend, and use them to locate reference points in the back-end, which indicate the input entry. Then, we apply targeted dataflow analysis to accurately detect dangerous uses of the untrusted user input. We implemented a prototype of SaTC and evaluated it on 39 embedded system firmwares from six popular vendors. SaTC discovered 33 unknown bugs, of which 30 are confirmed by CVE/CNVD/PSV. Compared to the state-ofthe-art tool KARONTE, SaTC found significantly more bugs on the test set. It shows that, SaTC is effective in discovering bugs in embedded systems.
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它引用的顶会 Paper9
- SOK: (State of) The Art of War: Offensive Techniques in Binary AnalysisYan Shoshitaishvili, Ruoyu Wang, Christopher Salls, Nick Stephens 等S&P 2016 · 被引用 1,085 次
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- Sensitive Information Tracking in Commodity IoTZ. Berkay Celik, Leonardo Babun, Amit Kumar Sikder, Hidayet Aksu 等USENIX Security 2018 · 被引用 236 次
- Karonte: Detecting Insecure Multi-binary Interactions in Embedded FirmwareNilo Redini, Aravind Machiry, Ruoyu Wang, Chad Spensky 等S&P 2020 · 被引用 128 次
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