Lune

MICRO2021顶会

A Deeper Look into RowHammer's Sensitivities: Experimental Analysis of Real DRAM Chipsand Implications on Future Attacks and Defenses

Lois Orosa, Abdullah Giray Yaglikçi, Haocong Luo, Ataberk Olgun, Jisung Park, Hasan Hassan, Minesh Patel, Jeremie S. Kim, Onur Mutlu

2021年份
74被引次数
29顶会引用

摘要

RowHammer is a circuit-level DRAM vulnerability where repeatedly accessing (i.e., hammering) a DRAM row can cause bit flips in physically nearby rows. The RowHammer vulnerability worsens as DRAM cell size and cell-to-cell spacing shrink. Recent studies demonstrate that modern DRAM chips, including chips previously marketed as RowHammer-safe, are even more vulnerable to RowHammer than older chips such that the required hammer count to cause a bit flip has reduced by more than 10X in the last decade. Therefore, it is essential to develop a better understanding and in-depth insights into the RowHammer vulnerability of modern DRAM chips to more effectively secure current and future systems.

Our goal in this paper is to provide insights into fundamental properties of the RowHammer vulnerability that are not yet rigorously studied by prior works, but can potentially be 𝑖) exploited to develop more effective RowHammer attacks or 𝑖𝑖) leveraged to design more effective and efficient defense mechanisms. To this end, we present an experimental characterization using 248 DDR4 and 24 DDR3 modern DRAM chips from four major DRAM manufacturers demonstrating how the RowHammer effects vary with three fundamental properties: 1) DRAM chip temperature, 2) aggressor row active time, and 3) victim DRAM cell's physical location. Among our 16 new observations, we highlight that a RowHammer bit flip 1) is very likely to occur in a bounded range, specific to each DRAM cell (e.g., 5.4% of the vulnerable DRAM cells exhibit errors in the range 70 °C to 90 °C), 2) is more likely to occur if the aggressor row is active for longer time (e.g., RowHammer vulnerability increases by 36% if we keep a DRAM row active for 15 column accesses), and 3) is more likely to occur in certain physical regions of the DRAM module under attack (e.g., 5% of the rows are 2x more vulnerable than the remaining 95% of the rows). Our study has important practical implications on future RowHammer attacks and defenses. We describe and analyze the implications of our new findings by proposing three future RowHammer attack and six future RowHammer defense improvements.

问问这篇 Paper

智能体会读完全文。

Lune 把这篇 Paper 索引到了每一个公式,引用它的顶会 Paper 也一样。你提问,回答直接引用原文。

可以从这些问题问起

智能体调用

Luneget_paper_fulltext

在 Lune 里问

免费开始,无需绑卡

引用它的顶会 Paper29

问问它们各自怎么用它

它引用的顶会 Paper22

相关 Paper

黄昏的海面,两侧是细线勾勒的悬崖