PyramidFlow: High-Resolution Defect Contrastive Localization Using Pyramid Normalizing Flow
Jiarui Lei, Xiaobo Hu, Yue Wang, Dong Liu
摘要
During industrial processing, unforeseen defects may arise in products due to uncontrollable factors. Although unsupervised methods have been successful in defect localization, the usual use of pre-trained models results in lowresolution outputs, which damages visual performance. To address this issue, we propose PyramidFlow, the first fully normalizing flow method without pre-trained models that enables high-resolution defect localization. Specifically, we propose a latent template-based defect contrastive localization paradigm to reduce intra-class variance, as the pre-trained models do. In addition, PyramidFlow utilizes pyramid-like normalizing flows for multi-scale fusing and volume normalization to help generalization. Our comprehensive studies on MVTecAD demonstrate the proposed method outperforms the comparable algorithms that do not use external priors, even achieving state-of-the-art performance in more challenging BTAD scenarios.
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引用它的顶会 Paper30
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它引用的顶会 Paper3
- Towards Total Recall in Industrial Anomaly DetectionKarsten Roth, Latha Pemula, Joaquin Zepeda, Bernhard Schölkopf 等CVPR 2022 · 被引用 1,301 次
- Why Normalizing Flows Fail to Detect Out-of-Distribution DataPolina Kirichenko, Pavel Izmailov, Andrew Gordon WilsonNeurIPS 2020 · 被引用 370 次
- Uninformed Students: Student-Teacher Anomaly Detection With Discriminative Latent EmbeddingsPaul Bergmann, Michael Fauser, David Sattlegger, Carsten StegerCVPR 2020
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