SSDL-ILT: Efficient ILT utilizing a self-supervised deep learning model
Rui Xu, Junqi Yang, Haoxiang Jiang, Ming Fang
Abstract
Inverse lithography technology (ILT) is an advanced resolution enhancement technique that achieves mask optimization at the pixel level. However, application of ILT is hindered by time-intensive physical simulation. Herein, we propose an efficient ILT algorithm leveraging a deep learning model. A novel loss function is constructed to guide the model training in a self-supervised manner, eliminating the requirement of labelled data that might be nontrivial to acquire. The trained model outputs final mask patterns without further ILT optimization. Sub-resolution assist features (SRAFs) are generated automatically, the complexity of which can be adjusted during the training process to control mask manufacturability. The model was trained and validated on ICCAD-2013 CAD contest dataset. Better pattern fidelity and up to 12,000 times speedup are observed compared to other SOTA models. The trained model also shows good generalization ability to geometrically-different design patterns from another dataset, via a few-shot learning approach.
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