Deep Metric Learning with Self-Supervised Ranking
Zheren Fu, Yan Li, Zhendong Mao, Quan Wang, Yongdong Zhang
Abstract
Deep metric learning aims to learn a deep embedding space, where similar objects are pushed towards together and different objects are repelled against. Existing approaches typically use inter-class characteristics, e.g., class-level information or instance-level similarity, to obtain semantic relevance of data points and get a large margin between different classes in the embedding space. However, the intra-class characteristics, e.g., local manifold structure or relative relationship within the same class, are usually overlooked in the learning process. Hence the data structure cannot be fully exploited and the output embeddings have limitation in retrieval. More importantly, retrieval results lack in a good ranking. This paper presents a novel self-supervised ranking auxiliary framework, which captures intra-class characteristics as well as inter-class characteristics for better metric learning. Our method defines specific transform functions to simulates the local structure change of intra-class in the initial image domain, and formulates a self-supervised learning procedure to fully exploit this property and preserve it in the embedding space. Extensive experiments on three standard benchmarks show that our method significantly improves and outperforms the state-of-the-art methods on the performances of both retrieval and ranking by 2%-4%.
Ask about this paper
Your agent reads all of it.
Lune indexed this paper to the last equation, along with the top-tier papers that cite it. Ask a question and the answer quotes them.
Your agent calls
Luneget_paper_fulltext
Free to start. No credit card required.
Terminal
Install the CLIlune papers fulltext b2e9963f-cd5a-4fcd-85d3-42475b30e6c1Cited by top-tier papers6
- Neighborhood-Adaptive Structure Augmented Metric LearningPandeng Li, Yan Li, Hongtao Xie, Lei ZhangAAAI 2022 · 29 citations
- Rethinking the Optimization of Average Precision: Only Penalizing Negative Instances before Positive Ones Is EnoughZhuo Li, Weiqing Min, Jiajun Song, Yaohui Zhu et al.AAAI 2022 · 12 citations
- Riemann-based Multi-scale Attention Reasoning Network for Text-3D RetrievalWenrui Li, Wei Han, Yandu Chen, Yeyu Chai et al.AAAI 2025 · 6 citations
- Learning Semantic Relationship among Instances for Image-Text MatchingZheren Fu, Zhendong Mao, Yan Song, Yongdong ZhangCVPR 2023
- Neural Collapse-Informed Initialization with Perturbation Injection in Classification-based Metric LearningJinhee Park, Hee Bin Yoo, Minjun Kim, Byoung-Tak Zhang et al.AAAI 2026
Builds on9
- A Simple Framework for Contrastive Learning of Visual RepresentationsTing Chen, Simon Kornblith, Mohammad Norouzi, Geoffrey E. HintonICML 2020 · 24,064 citations
- SoftTriple Loss: Deep Metric Learning Without Triplet SamplingQi Qian, Lei Shang, Baigui Sun, Juhua Hu et al.ICCV 2019 · 419 citations
- MIC: Mining Interclass Characteristics for Improved Metric LearningBiagio Brattoli, Karsten Roth, Björn OmmerICCV 2019 · 100 citations
- Metric Learning With HORDE: High-Order Regularizer for Deep EmbeddingsPierre Jacob, David Picard, Aymeric Histace, Edouard KleinICCV 2019 · 64 citations
- PADS: Policy-Adapted Sampling for Visual Similarity LearningKarsten Roth, Timo Milbich, Björn OmmerCVPR 2020
Related papers
- Self-Taught Metric Learning without LabelsSungyeon Kim, Dongwon Kim, Minsu Cho, Suha KwakCVPR 2022 · 18 citations
- Deep Relational Metric LearningWenzhao Zheng, Borui Zhang, Jiwen Lu, Jie ZhouICCV 2021 · 53 citations
- Integrating Language Guidance into Vision-based Deep Metric LearningKarsten Roth, Oriol Vinyals, Zeynep AkataCVPR 2022 · 1 citation
- Relative Order Analysis and Optimization for Unsupervised Deep Metric LearningShichao Kan, Yigang Cen, Yang Li, Vladimir Mladenovic et al.CVPR 2021
- SLADE: A Self-Training Framework for Distance Metric LearningJiali Duan, Yen-Liang Lin, Son Dinh Tran, Larry S. Davis et al.CVPR 2021
