Risk Bounds for Over-parameterized Maximum Margin Classification on Sub-Gaussian Mixtures
Yuan Cao, Quanquan Gu, Mikhail Belkin
Abstract
Modern machine learning systems such as deep neural networks are often highly over-parameterized so that they can fit the noisy training data exactly, yet they can still achieve small test errors in practice. In this paper, we study this "benign overfitting" phenomenon of the maximum margin classifier for linear classification problems. Specifically, we consider data generated from sub-Gaussian mixtures, and provide a tight risk bound for the maximum margin linear classifier in the over-parameterized setting. Our results precisely characterize the condition under which benign overfitting can occur in linear classification problems, and improve on previous work. They also have direct implications for over-parameterized logistic regression. Very recently, benign overfitting has also been studied in the setting of linear classification [6, 19, 25] . Specifically, [19] studied the setting where the data inputs are Gaussian and the labels are generated 35th Conference on Neural Information Processing Systems (NeurIPS 2021).
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