Dynamic Pseudo Labeling via Gradient Cutting for High-Low Entropy Exploration
Jae Hyeon Park, Joo Hyeon Jeon, Jae Yun Lee, Sangyeon Ahn, Minhee Cha, Min Geol Kim, Hyeok Nam, Sung In Cho
Abstract
This study addresses the limitations of existing dynamic pseudo-labeling (DPL) techniques, which often utilize static or dynamic thresholds for confident sample selection. The existing methods fail to capture the non-linear relationship between task accuracy and model confidence, particularly in the context of overconfidence. This can limit the model's learning opportunities for high entropy samples that significantly influence a model's generalization ability. To solve this, we propose a novel gradient pass-based DPL technique that incorporates the high-entropy samples, which are typically overlooked. Our approach introduces two classifiers-low gradient pass (LGP) and high gradient pass (HGP)-to derive over-and under-confident dynamic thresholds that indicate the class-wise overconfidence acceleration, respectively. By combining the under-and overconfident states from the GP classifiers, we create a more adaptive and accurate PL method. Our main contributions highlight the importance of considering both low and high-confidence samples in enhancing the model's robustness and generalization for improved PL performance.
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