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Tradeoffs for small-depth Frege proofs

Toniann Pitassi, Prasanna Ramakrishnan, Li-Yang Tan

2021Year
2Citations
1Top-tier citations

Abstract

We study the complexity of small-depth Frege proofs and give the first tradeoffs between the size of each line and the number of lines. Existing lower bounds apply to the overall proof size-the sum of sizes of all lines-and do not distinguish between these notions of complexity. For depth-d Frege proofs of the Tseitin principle where each line is a size-s formula, we prove thatexp⁡(n/2Ω(dlog⁡s))\exp(n/2^{\Omega(d\sqrt{\log s})})many lines are necessary. This yields new lower bounds on line complexity that are not implied byHa ⁣ ⁣ ⁣ ⁣∘stad\mathbf{H}\mathop{\mathbf{a}}\!\!\!\!^{\circ}\mathbf{stad}'s recentexp⁡(nΩ(1/d))\exp(n^{\Omega(1/d)})lower bound on the overall proof size. Forss= poly(n)(n), for example, our lower bound remainsexp⁡(n1−o(1))\exp(n^{1-o(1)})for alld=o(log⁡n)d=o(\sqrt{\log n}), whereasHa ⁣ ⁣ ⁣ ⁣∘stad\mathbf{H}\mathop{\mathbf{a}}\!\!\!\!^{\circ}\mathbf{stad}'s lower bound isexp⁡(no(1))\exp(n^{o(1)})onced =ωn(1)d\ = \omega_{n}(1). Our main conceptual contribution is the simple obser-vation that techniques for establishing correlation bounds in circuit complexity can be leveraged to establish such tradeoffs in proof complexity.

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