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FITS: Inferring Intermediate Taint Sources for Effective Vulnerability Analysis of IoT Device Firmware

Puzhuo Liu, Yaowen Zheng, Chengnian Sun, Chuan Qin, Dongliang Fang, Mingdong Liu, Limin Sun

2023Year
21Citations
6Top-tier citations

Abstract

Finding vulnerabilities in firmware is vital as any firmware vulnerability may lead to cyberattacks to the physical IoT devices. Taint analysis is one promising technique for finding firmware vulnerabilities thanks to its high coverage and scalability. However, sizable closed-source firmware makes it extremely difficult to analyze the complete data-flow paths from taint sources (i.e., interface library functions such as recv) to sinks.

We observe that certain custom functions in binaries can be used as intermediate taint sources (ITSs). Compared to interface library functions, using custom functions as taint sources can significantly shorten the data-flow paths for analysis. However, inferring ITSs is challenging due to the complexity and customization of firmware. Moreover, the debugging information and symbol table of binaries in firmware are stripped; therefore, prior techniques of inferring taint sources are not applicable except laborious manual analysis. To this end, this paper proposes FITS to automatically infer ITSs. Specifically, FITS represents each function with a novel behavioral

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