A Low-Cost Feature Interaction Fault Localization Approach for Software Product Lines
Haining Wang, Yi Xiang, Han Huang, Jie Cao, Kaichen Chen, Xiaowei Yang
Abstract
In Software Product Lines (SPLs), localizing buggy feature interactions helps developers identify the root cause of test failures, thereby reducing their workload. This task is challenging because the number of potential interactions grows exponentially with the number of features, resulting in a vast search space, especially for large SPLs. Previous approaches have partially addressed this issue by constructing and examining potential feature interactions based on suspicious feature selections (e.g., those present in failed configurations but not in passed ones). However, these approaches often overlook the causal relationship between buggy feature interaction and test failures, resulting in an excessive search space and high-cost fault localization. To address this, we propose a low-cost Counterfactual Reasoning-Based Fault Localization (CRFL) approach for SPLs, which enhances fault localization efficiency by reducing both the search space and redundant computations. Specifically, CRFL employs counterfactual reasoning to infer suspicious feature selections and utilizes symmetric uncertainty to filter out irrelevant feature interactions. Additionally, CRFL incorporates two findings to prevent the repeated generation and examination of the same feature interactions. We evaluate the performance of our approach using eight publicly available SPL systems. To enable comparisons on larger real-world SPLs, we generate multiple buggy mutants for both BerkeleyDB and TankWar. Experimental results show that our approach reduces the search space by 51%∼73% for small SPLs (with 6∼9 features) and by 71%∼88% for larger SPLs (with 13∼99 features). The average runtime of our approach is approximately 15.6 times faster than that of a state-of-the-art method. Furthermore, when combined with statement-level localization techniques, CRFL can efficiently localize buggy statements, demonstrating its ability to accurately identify buggy feature interactions.
Ask about this paper
Ask your agent about it.
Lune has read the top-tier papers around this one, so every answer names the papers it rests on.
Related papers
- Causality in Configurable Software SystemsClemens Dubslaff, Kallistos Weis, Christel Baier, Sven ApelICSE 2022 · 24 citations
- FLACK: Counterexample-Guided Fault Localization for Alloy ModelsGuolong Zheng, ThanhVu Nguyen, Simón Gutiérrez Brida, Germán Regis et al.ICSE 2021 · 18 citations
- Integrating Multiple Features for Weakly-Supervised False-Passing Products Detection in Software Product LinesTao Zhang, Yan Lei, Haoran Xia, Huan Xie et al.ISSTA 2026
- Blackbox Observability of Features and Feature InteractionsKallistos Weis, Leopoldo Teixeira, Clemens Dubslaff, Sven ApelASE 2024 · 1 citation
- Improving Fault Localization by Integrating Value and Predicate Based Causal Inference TechniquesYigit Küçük, Tim A. D. Henderson, Andy PodgurskiICSE 2021 · 6 citations
