NeurIPS2020

Truncated Linear Regression in High Dimensions

Constantinos Daskalakis, Dhruv Rohatgi, Emmanouil Zampetakis

18 citations

Abstract

As in standard linear regression, in truncated linear regression, we are given access to observations (A i , y i ) i whose dependent variable equals y i = A T i • x * + η i , where x * is some fixed unknown vector of interest and η i is independent noise; except we are only given an observation if its dependent variable y i lies in some "truncation set" S ⊂ R. The goal is to recover x * under some favorable conditions on the A i 's and the noise distribution. We prove that there exists a computationally and statistically efficient method for recovering k-sparse n-dimensional vectors x * from m truncated samples, which attains an optimal 2 reconstruction error of O( (k log n)/m). As a corollary, our guarantees imply a computationally efficient and information-theoretically optimal algorithm for compressed sensing with truncation, which may arise from measurement saturation effects. Our result follows from a statistical and computational analysis of the Stochastic Gradient Descent (SGD) algorithm for solving a natural adaptation of the LASSO optimization problem that accommodates truncation. This generalizes the works of both: (1) Daskalakis et al. [9], where no regularization is needed due to the low-dimensionality of the data, and (2) Wainright [26] , where the objective function is simple due to the absence of truncation. In order to deal with both truncation and high-dimensionality at the same time, we develop new techniques that not only generalize the existing ones but we believe are of independent interest. 1 regularization, i.e. what is called LASSO optimization in Statistics, in order to reward sparsity. Another common deviation from the standard model is the presence of truncation. Truncation occurs when the sample (A i , y i ) is not observed whenever y i falls outside of a subset S ⊆ R. Truncation arises quite often in practice as a result of saturation of measurement devices, bad data collection practices, incorrect 1